The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2020
Filed:
Aug. 25, 2015
B&w Tek Llc, Washington, DC (US);
Jun Zhao, The Woodlands, TX (US);
Xin Jack Zhou, Hockessin, DE (US);
B&W TEK LLC, Washington, DC (US);
Abstract
A system and method for determining the composition of a sample is provided. The system and method according to the present invention comprises: obtaining one or more spectra of the sample; obtaining one or more spectra of one or more target materials; pre-process the sample and the target spectra; providing a variable reduction means that combines certain contiguous spectral variables into a single variable, wherein the intensities of the said single variable is the sum of the intensities of the said spectral variables to be combined; determining an average spectrum and the statistic distribution of the sample and/or each of the target material in the reduced dimension; determining the likelihood the sample had the same composition of each of the one or more target material; and displaying the list of the most likely target material to a user.