The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2020

Filed:

Apr. 18, 2017
Applicant:

The Government of the United States of America, As Represented BY the Secretary of the Navy, Washington, DC (US);

Inventors:

Brandon F. Redding, Alexandria, VA (US);

Allen R. Davis, Falls Church, VA (US);

Clay K. Kirkendall, Fairfax, VA (US);

Anthony Dandridge, Fairfax Station, VA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01J 9/02 (2006.01);
U.S. Cl.
CPC ...
G01J 9/02 (2013.01);
Abstract

A method of interferometric optical sensing via spatial demodulation includes emitting a laser beam; splitting the laser beam into a reference beam and an interrogation beam; converting a desired signal into a change in the optical path of the interrogation beam via an optical sensor; and capturing the reference beam and the interrogation beam via a camera, wherein the interrogation beam is incident to the camera at a first angle and the reference beam is incident to the camera at a second angle different from the first angle, thereby causing an interference pattern at the camera.


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