The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2020

Filed:

May. 08, 2015
Applicant:

Hp Indigo B.v., Amstelveen, NL;

Inventors:

Nimrod Lucas, Ness Ziona, IL;

Ofer Hollenberg, Ness Ziona, IL;

Ran Soffer, Yavne, IL;

Assignee:

HP Indigo B.V., Amstelveen, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41F 13/02 (2006.01); B65H 23/188 (2006.01); B41F 33/02 (2006.01); G01D 5/347 (2006.01); G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
B41F 13/02 (2013.01); B41F 33/02 (2013.01); B65H 23/1882 (2013.01); G01D 5/34707 (2013.01); G01D 5/34746 (2013.01); G01D 18/00 (2013.01); B65H 2220/03 (2013.01); B65H 2515/40 (2013.01); B65H 2553/51 (2013.01); B65H 2557/61 (2013.01);
Abstract

Example implementations relate to determining a correction factor that converts a measured sensor distance () to a calibrated sensor distance (). The measured sensor distance may be based on an amount of substrate advancement through a web printing press () between detecting a mark (--N) on the substrate () at a first sensor () and detecting the mark at a second sensor (). The calibrated sensor distance () may be the separation between the first sensor and the second sensor.


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