The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2020

Filed:

Nov. 23, 2016
Applicants:

Jennifer Hertzoff, Tempe, AZ (US);

Hermann A. Hofer, Phoenix, AZ (US);

Inventors:

Jennifer Hertzoff, Tempe, AZ (US);

Hermann A. Hofer, Phoenix, AZ (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61N 5/10 (2006.01); A61B 6/08 (2006.01); A61B 6/14 (2006.01); A61B 6/00 (2006.01); G21K 5/04 (2006.01); A61B 90/35 (2016.01); A61B 5/00 (2006.01); H01J 37/22 (2006.01); H01J 35/16 (2006.01); G01C 15/00 (2006.01); A61B 90/30 (2016.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
A61N 5/1049 (2013.01); A61B 5/70 (2013.01); A61B 6/08 (2013.01); A61B 6/14 (2013.01); A61B 6/587 (2013.01); A61B 6/589 (2013.01); A61B 90/35 (2016.02); G21K 5/04 (2013.01); H01J 35/165 (2013.01); H01J 37/226 (2013.01); A61B 90/30 (2016.02); A61B 2090/3945 (2016.02); A61N 2005/1056 (2013.01); G01C 15/004 (2013.01); G01N 2201/0245 (2013.01); G01N 2201/06106 (2013.01); H01J 2237/045 (2013.01); H01J 2237/0456 (2013.01); H01J 2237/1501 (2013.01); H01J 2237/2482 (2013.01);
Abstract

The invention comprises an alignment guide apparatus and a method of use thereof for aligning an imaging beam, longitudinally passing through an exit nozzle of an imaging system, to an imaging zone of a sample, includes the steps of: (1) providing an alignment guide, the alignment guide comprising: (a) a guide wall at least partially circumferentially enclosing an aperture, (b) a first laser element connected to the guide wall, and (c) a second laser element connected to the guide wall; (2) inserting the exit nozzle of the imaging system into the aperture; (3) projecting a first line from the first laser element onto the sample; (4) projecting a second line from the second laser element onto the sample; and (5) moving the sample relative to the exit nozzle of the imaging system to position an intersection of the first line and the second line at the imaging zone to align the imaging beam to the imaging zone.


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