The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2020
Filed:
Jun. 02, 2017
Benoit Lepage, L'Ancienne-Lorette, CA;
Guillaume Painchaud-april, L'Ancienne-Lorette, CA;
Christophe Imbert, St. Augustin de Desmaures, CA;
Charles Grimard, Quebec, CA;
Benoit Lepage, L'Ancienne-Lorette, CA;
Guillaume Painchaud-April, L'Ancienne-Lorette, CA;
Christophe Imbert, St. Augustin de Desmaures, CA;
Charles Grimard, Quebec, CA;
Olympus Scientific Solutions Americas Inc., Waltham, MA (US);
Abstract
Disclosed is a calibration system and method for a phased array ultrasound pipe inspection system, in which reliable calibration is obtained for notches at all angles using only a small number of notches for the calibration. The method comprises a one-time normalization step and a system calibration step which may be performed at regular intervals. Ultrasound transmission is in a single diverging beam for each aperture, while reception is selective for multiple well-defined reception angles. During the normalization step, plots of maximum response vs reception angle are plotted for each notch, and a normalization curve is constructed by fitting the maxima of these plots. The normalization curve is used to derive calibration targets at specific reception angles for specific calibration notches, which are then used for the system calibrations.