The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2020
Filed:
Dec. 21, 2018
Applicant:
Tufts University, Medford, MA (US);
Inventors:
Valencia Koomson, Danvers, MA (US);
Chirag Sthalekar, Burlington, MA (US);
Assignee:
Tufts University, Medford, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01); A61B 5/00 (2006.01); A61B 5/1455 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0075 (2013.01); A61B 5/14552 (2013.01); A61B 2560/0233 (2013.01); A61B 2562/0238 (2013.01); A61B 2562/0242 (2013.01); A61B 2576/00 (2013.01);
Abstract
A system and method, for measuring phase delay and amplitude of a near infrared signal emanating from tissue of an animal subject in response a near infrared signal input to such tissue, operate by processing a signal from an optical detector and a corresponding signal from an optical detector emulation circuit. In some aspects, the processed signals are fed into a phase delay detection system that provides an output thereof a digital measure of the phase delay of the received optical signal.