The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2020
Filed:
Jan. 24, 2014
Applicant:
Hewlett Packard Enterprise Development Lp, Houston, TX (US);
Inventor:
Eric Owhadi, Houston, TX (US);
Assignee:
HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP, Houston, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06K 9/62 (2006.01); G06F 17/16 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
H04L 63/1425 (2013.01); H04L 63/1416 (2013.01); G06F 17/16 (2013.01); G06F 17/18 (2013.01); G06K 9/6284 (2013.01);
Abstract
In an example, metrics that cause a deviation in data may be identified by collecting the data for selected metrics stored in a plurality of tables. A metric vector is constructed based on the data for the selected metrics. A probability density may be calculated for the metric vector that indicates a deviation value for the metric vector relative to other metric vectors. Moreover, an outlier metric from the metric vector that causes the deviation value for the metric vector may be identified.