The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2020

Filed:

Mar. 01, 2018
Applicant:

Cpg Technologies, Llc, Italy, TX (US);

Inventors:

James F. Corum, Morgantown, WV (US);

Kenneth L. Corum, Plymouth, NH (US);

Timothy J. Lougheed, Jr., Midlothian, TX (US);

Jerry A. Lomax, Katy, TX (US);

Assignee:

CPG TECHNOLOGIES, INC, Italy, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01P 5/00 (2006.01); H02J 50/20 (2016.01); H04B 3/52 (2006.01); H01P 3/18 (2006.01); G01S 13/02 (2006.01); H02J 50/12 (2016.01); H01Q 1/36 (2006.01); H01Q 9/30 (2006.01); G01S 13/88 (2006.01);
U.S. Cl.
CPC ...
H01P 5/00 (2013.01); G01S 13/0218 (2013.01); G01S 13/88 (2013.01); H01P 3/18 (2013.01); H01Q 1/36 (2013.01); H01Q 9/30 (2013.01); H02J 50/12 (2016.02); H02J 50/20 (2016.02); H04B 3/52 (2013.01);
Abstract

Disclosed is an exemplary guided surface waveguide probe. In one embodiment, the guided surface waveguide probe comprises a charge terminal elevated to a height above the lossy conducting medium; a support structure that supports the charge terminal; an internal coil that is supported within the support structure and is coupled to an excitation source; a conductive tube having a first end conductively coupled to the at least one section of internal coil, wherein a second end of the conductive tube extends vertically towards and is electrically coupled to the charge terminal; at least one sensor electrically coupled to the charge terminal or the internal coil, wherein the at least one sensor measures an operational parameter of the guided surface waveguide probe; and a non-conductive channel connected to the at least one sensor by which data associated with the operational parameter is communicated.


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