The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2020
Filed:
Nov. 06, 2018
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Korea Advanced Institute of Science and Technology, Daejeon, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
KOREAN ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY, Daejeon, KR;
Abstract
Provided are a method and apparatus for interpolating X-ray tomographic image data by using a machine learning model. A method of interpolating an X-ray tomographic image or X-ray tomographic composite image data includes obtaining a trained model parameter via machine learning that uses a sub-sampled sinogram for learning as an input and uses a full-sampled sinogram for learning as a ground truth; radiating X-rays onto an object at a plurality of preset angular locations via an X-ray source, and obtaining a sparsely-sampled sinogram including X-ray projection data obtained via X-rays detected at the plurality of preset angular locations; applying the trained model parameter to the sparsely-sampled sinogram by using the machine learning model; and generating a densely-sampled sinogram by estimating X-ray projection data not obtained with respect to the object on the sparsely-sampled sinogram.