The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2020

Filed:

Jul. 28, 2017
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Yong Ju Cho, Daejeon, KR;

Soon-heung Jung, Daejeon, KR;

Hyun Cheol Kim, Sejong-si, KR;

Jeongil Seo, Daejeon, KR;

Joo Myoung Seok, Daejeon, KR;

Sangwoo Ahn, Daejeon, KR;

Seung Jun Yang, Daejeon, KR;

Injae Lee, Daejeon, KR;

Hee Kyung Lee, Daejeon, KR;

Seong Yong Lim, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); G06K 9/20 (2006.01); H04N 9/097 (2006.01); G06T 3/00 (2006.01); H04N 13/225 (2018.01); G06K 9/00 (2006.01); H04N 5/262 (2006.01); H04N 5/232 (2006.01); G06T 3/40 (2006.01); H04N 13/239 (2018.01); H04N 13/00 (2018.01);
U.S. Cl.
CPC ...
G06K 9/20 (2013.01); G06K 9/00771 (2013.01); G06T 3/0081 (2013.01); H04N 5/23238 (2013.01); H04N 5/2622 (2013.01); H04N 9/097 (2013.01); H04N 13/225 (2018.05); G06K 2009/2045 (2013.01); G06T 3/4038 (2013.01); H04N 13/239 (2018.05); H04N 2013/0088 (2013.01);
Abstract

Provided is a parallax minimization stitching method and apparatus using control points in an overlapping region. A parallax minimization stitching method may include defining a plurality of control points in an overlapping region of a first image and a second image received from a plurality of cameras, performing a first geometric correction by applying a homography to the control points, defining a plurality of patches based on the control points, and performing a second geometric correction by mapping the patches.


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