The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2020
Filed:
Dec. 28, 2016
Applicant:
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Inventors:
Bhaskar Saha, Redwood City, CA (US);
Tomonori Honda, Redwood City, CA (US);
Ion Matei, Mountain View, CA (US);
Daniel G. Bobrow, Palo Alto, CA (US);
Johan Dekleer, Los Altos, CA (US);
William C. Janssen, Mountain View, CA (US);
Tolga Kurtoglu, San Jose, CA (US);
Assignee:
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 17/50 (2006.01); G06F 11/00 (2006.01); G06F 17/18 (2006.01); G05B 23/02 (2006.01); G06N 7/00 (2006.01); G06N 7/02 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 17/5009 (2013.01); G05B 23/0256 (2013.01); G06F 11/004 (2013.01); G06F 11/008 (2013.01); G06F 17/18 (2013.01); G05B 23/0243 (2013.01); G05B 23/0248 (2013.01); G06N 7/005 (2013.01); G06N 7/02 (2013.01); G06N 7/023 (2013.01); G06N 20/00 (2019.01);
Abstract
A new and/or improved method, apparatus and/or system is disclosed which aids in extending correct behavioral models to include fault modes and in fault mode analysis of components and/or systems in simulated model environments, including, e.g., FMEA and FMECA and diagnostic fault tree generation.