The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2020

Filed:

Dec. 28, 2017
Applicant:

Cerner Innovation, Inc., Kansas City, KS (US);

Inventors:

Arindam Das, West Bengal, IN;

Sudipta Bhattacharjee, West Bengal, IN;

Ankur Bhatia, West Bengal, IN;

Assignee:

Cerner Innovation, Inc., Kansas City, KS (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/00 (2006.01); G06F 9/44 (2018.01); G06F 9/46 (2006.01); G06F 13/00 (2006.01); G06F 9/54 (2006.01);
U.S. Cl.
CPC ...
G06F 9/546 (2013.01); G06F 9/465 (2013.01);
Abstract

Methods, systems, and computer-readable media are disclosed herein for enabling inbound testing. Aspects herein provide a tool that can, from with a single application, generate test HL7 transaction messages and send the generated test HL7 messages to an inbound testing interface to monitor performance of a testing interface. The tool provides a mechanism to generate a large number of test HL7 messages having different identifier types and message types simultaneously. The tool also provides a mechanism to send large numbers of test HL7 messages, of different identifier types and message types, simultaneously, to a testing environment via multiple pipes.


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