The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2020

Filed:

Oct. 26, 2017
Applicant:

Scopio Labs Ltd., Tel Aviv, IL;

Inventors:

Ben Leshem, Tel Aviv, IL;

Itai Hayut, Tel Aviv, IL;

Erez Na'Aman, Tel Aviv, IL;

Eran Small, Tel Aviv, IL;

Assignee:

Scopio Labs Ltd., Tel Aviv, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16H 30/40 (2018.01); G02B 21/36 (2006.01); G01N 21/17 (2006.01); G01N 21/25 (2006.01); G02B 21/34 (2006.01); G02B 21/14 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G01N 21/17 (2013.01); G01N 21/25 (2013.01); G02B 21/14 (2013.01); G02B 21/34 (2013.01); G02B 21/367 (2013.01); G16H 30/40 (2018.01);
Abstract

Disclosed herein are systems and methods for constructing an image of a sample using a plurality of images acquired under multiple illumination conditions. In some cases, a microscope may include an image capture device, an illumination assembly, and a processor configured to acquire a plurality of images of a sample and a fiducial marker under a plurality of different illumination conditions and to reconstruct a high resolution image in response to the plurality of images. The disclosure also provides a method for generating a high resolution image of a sample comprising acquiring a plurality of images of a sample and a fiducial marker under a plurality of different illumination conditions and reconstructing the high resolution image in response to the plurality of images.


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