The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2020
Filed:
Mar. 31, 2016
Total SA, Courbevoie, FR;
TOTAL SA, Courbevoie, FR;
Abstract
The method processes, for each of a plurality of shots at respective source locations, seismic traces recorded at a plurality of receiver locations. Common-mid-point-modulated data are also computed by multiplying the seismic data in each seismic trace by a horizontal mid-point. A depth migration process is applied to the seismic data to obtain a first set of migrated data, and to the mid-point-modulated data to obtain a second set of migrated data. For each shot, aperture values are estimated and associated with respective subsurface positions. A migrated value for a depth and an aperture in a surface aperture common image gather at a horizontal position is a migrated value of the first set of migrated data for a shot such that the estimated aperture value associated with that subsurface position is the aperture.