The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2020

Filed:

Jan. 23, 2017
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Michael Bleyer, Seattle, WA (US);

Raymond Kirk Price, Redmond, WA (US);

Jian Zhao, Kenmore, WA (US);

Denis Claude Pierre Demandolx, Bellevue, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01S 7/48 (2006.01); G01S 7/497 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4808 (2013.01); G01S 7/497 (2013.01);
Abstract

A computer-implemented technique is described herein for invalidating pixels in a time-of-flight depth-sensing device based on active brightness (AB) measurements. In one implementation, the technique involves, for each sensing element of a sensor: generating frequency-specific sensor readings in response to receiving instances of radiation having plural frequencies (e.g., frequencies f, f, and f); generating a set of active brightness measurements (AB, AB, and AB) associated with the respective frequencies; generating a variation measure that reflects an extent of variation within the set of active brightness measurements; and invalidating a pixel associated with the particular sensing element if the variation measure satisfies a prescribed invalidation condition.


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