The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2020

Filed:

Sep. 15, 2017
Applicant:

Uih America, Inc., Houston, TX (US);

Inventors:

Yuan Zheng, Houston, TX (US);

Yu Ding, Houston, TX (US);

Weiguo Zhang, Houston, TX (US);

Assignee:

UIH AMERICA, INC., Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/561 (2006.01); G01R 33/48 (2006.01); G01R 33/56 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5612 (2013.01); G01R 33/4818 (2013.01); G01R 33/565 (2013.01); G01R 33/5608 (2013.01); G01R 33/5616 (2013.01);
Abstract

A method and system for reducing Nyquist ghost artifact is provide. The method may include: obtaining a plurality of measured data sets; determining, based on the plurality of measured data sets, in a data space, a plurality of convolution kernels, each convolution kernel relating to all of the plurality of measured data sets; generating, based on the plurality of convolution kernels and the plurality of measured data sets, in the data space, a plurality of synthetic data sets; generating, based on the plurality of synthetic data sets and the plurality of measured data sets, in the data space, a plurality of combined data sets, each combined data set relating to one of the plurality of synthetic data sets and a corresponding measured data set of the plurality of measured data sets; and reconstructing, based on the plurality of combined data sets, an image.


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