The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2020

Filed:

Jan. 23, 2018
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Hiroaki Furukawa, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/02 (2006.01); G01N 23/2206 (2018.01); G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2206 (2013.01); G01N 23/223 (2013.01); G01N 2223/05 (2013.01); G01N 2223/076 (2013.01); G01N 2223/60 (2013.01);
Abstract

A resin discriminating apparatus includes an X-ray tube which emits X-rays, an X-ray detector which detects X-rays emitted from a sample irradiated with X-rays, a data processing section which creates a spectrum on the basis of a detection signal obtained by the X-ray detector, a peak extraction section which extracts a spectral line due to Compton scattering and a spectral line due to Rayleigh scattering derived from a target element of the X-ray tube on the spectrum, and obtains a peak intensity, and a discrimination section which calculates a scattering intensity ratio which is a ratio of the Rayleigh scattering intensity to the Compton scattering intensity and discriminates the type of resin contained in the sample from the scattering intensity ratio.


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Furukawa, Hiroaki. (2020). Method and apparatus for discriminating resin (U.S. Patent No. 10557808). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10557808

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