The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2020

Filed:

Jan. 02, 2018
Applicant:

Owens-brockway Glass Container Inc., Perrysburg, OH (US);

Inventors:

James Ringlien, Maumee, OH (US);

William Anderson, Toledo, OH (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01M 11/00 (2006.01); G01N 21/93 (2006.01); G01N 21/90 (2006.01); G01N 21/956 (2006.01); G01B 11/30 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G01N 21/93 (2013.01); G01B 11/25 (2013.01); G01B 11/30 (2013.01); G01N 21/9054 (2013.01); G01N 21/956 (2013.01);
Abstract

An inspection device calibration method includes mounting a laser-operated calibration device to a calibration fixture including an adjustable target having alignment indicia; illuminating the adjustable target with laser light from the calibration device; adjusting the adjustable target to operatively align the alignment indicia with the laser light; removing the calibration device from the calibration fixture; mounting to the calibration fixture, an inspection device including one or more adjustable features; and operating the optical inspection device, including adjusting the inspection device to operatively align the inspection device with the adjustable target.


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