The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2020

Filed:

Jan. 19, 2016
Applicant:

Topcon Corporation, Itabashi-ku, JP;

Inventor:

Taichi Yuasa, Itabashi-ku, JP;

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/38 (2006.01); G01N 21/359 (2014.01); G01N 21/3563 (2014.01);
U.S. Cl.
CPC ...
G01N 21/359 (2013.01); G01N 21/3563 (2013.01); G01N 33/383 (2013.01); G01N 2201/061 (2013.01); G01N 2201/068 (2013.01); G01N 2201/0637 (2013.01);
Abstract

A spectroscopic measuring device includes a halogen lamp as a light source, a lens of an irradiating system, a mirror, and a spectrometer. The lens of the irradiating optical system emits light from the halogen lamp to a measurement object. The mirror is an optical member, and the mirror is arranged coaxial with the lens and conducts detecting light between the halogen lamp and the measurement object, to the spectrometer. The spectrometer is an analyzing part and analyzes material of the measurement object on the basis of the light received via the mirror. The light from the halogen lamp to the measurement object passes through the peripheral part of the optical axis of the lens, and the light to be received by the spectrometer passes through the center part of the optical axis of the lens, at the position of the mirror.


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