The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2020
Filed:
Dec. 28, 2018
Applicants:
Sakhrat Khizroev, Miami, FL (US);
Rakesh Guduru, Miami, FL (US);
Dwayne Mcdaniel, Miramar, FL (US);
Inventors:
Assignee:
The Florida International University Board of Trustees, Miami, FL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/24 (2006.01); H01F 1/34 (2006.01); G02B 27/28 (2006.01); H01F 1/00 (2006.01); G01L 1/12 (2006.01); H01L 41/187 (2006.01); H01F 27/28 (2006.01); H01F 27/255 (2006.01); G01M 5/00 (2006.01); G01M 11/00 (2006.01); H01L 41/113 (2006.01);
U.S. Cl.
CPC ...
G01L 1/247 (2013.01); G01L 1/12 (2013.01); G01M 5/0091 (2013.01); G01M 11/005 (2013.01); G02B 27/288 (2013.01); H01F 1/0045 (2013.01); H01F 1/0054 (2013.01); H01F 1/344 (2013.01); H01F 27/255 (2013.01); H01F 27/2804 (2013.01); H01L 41/1132 (2013.01); H01L 41/1871 (2013.01);
Abstract
Systems for screening and health monitoring of materials are provided. The system can include a material embedded with magneto-electric nanoparticles (MENs), a laser configured to direct incident laser light waves at a target area of the material, an optical filter disposed between the laser and the material, and an analyzer configured to detect the laser light reflected from the material.