The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2020
Filed:
May. 13, 2016
Schlumberger Technology Corporation, Sugar Land, TX (US);
Helen Robinson, Cambridge, GB;
Daniele Molteni, Cambridge, GB;
Ian Bradford, Cambridge, GB;
SCHLUMBERGER TECHNOLOGY CORPORATION, Sugar Land, TX (US);
Abstract
Processing strain measurement signals from a first measured signal representing a first received backscattered optical signal for a first sensor—the first measured signal associated with a first phase signal—and a second measured signal representing a second received backscattered optical signal for a second sensor. The second measured signal is associated with a second phase signal constituting a consolidation of the first phase signal and an additional phase signal—where the additional phase signal is unrecoverable from the first measured signal. The first phase signal is determined from the first measured signal and processed. The second phase signal is determined from the second measured signal, where the first phase signal and additional phase signal are indistinguishable in the phase domain. The second phase signal is processed to obtain the additional phase signal and a strain measurement signal is constructed using the processed first phase signal and additional phase signal.