The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2020
Filed:
May. 19, 2017
Kba-notasys SA, Lausanne, CH;
Jacques Perrier, Commugny, CH;
KBA-NOTASYS SA, Lausanne, CH;
Abstract
There is described a process of measuring print-to-print register of a multicolour print (A-D) provided in an effective printed area (EPA) of the surface of printed material, which multicolour print (A-D) is formed on the printed material by means of one or more printing presses and includes at least a first pattern (A) and a second pattern (B) distinguishable from the first pattern (A), the effective printed area (EPA) being provided with a matrix arrangement of individual imprints (P) which are each provided with the multicolour print (A-D) and are repeated over the surface of the effective printed area (EPA) along a pattern of rows and columns. Measurement of an actual print-to-print register between the first and second patterns (A, B), as reflected on the printed material, is derived from processing and finding a correspondence between (i) at least one sample image (SI, SI) of the printed material covering at least a portion of the first and second patterns (A, B), and (ii) at least one corresponding reference image (RI, RI) generated using prepress design data of the first and second patterns (A, B). Furthermore, the process is repeated for multiple ones of the individual imprints (P) so as to derive a set of multiple measurements of the actual print-to-print register between the first and second patterns (A, B) at various imprint locations over the effective printed area (EPA), which set of multiple measurements is mapped into a corresponding print-to-print register map (M, M, M, . . . ) that is representative of print-to-print register deviations at the various imprint locations. Also described is a measuring device for carrying out this process and a process of measuring and correcting print-to-print register of a multicolour print.