The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2020
Filed:
Jun. 05, 2017
Samsung Electronics Co., Ltd., Suwon-si, KR;
Hong-Geun Kim, Suwon-si, KR;
Seung Hyun Kim, Anyang-si, KR;
Sung Ha Park, Suwon-si, KR;
Ji Young Park, Seoul, KR;
Kyung-Mi Song, Suwon-si, KR;
Dae Sun Lee, Hwaseong-si, KR;
Jong Gun Lee, Yongin-si, KR;
Jong Yup Choi, Suwon-si, KR;
Yu Kyung Tak, Seoul, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
A fluid analysis cartridge with improved test reliability and an associated fluid analysis cartridge assembly are disclosed herein. A fluid analysis cartridge assembly includes a sample collecting member having a sample collecting chamber and a fluid analysis cartridge configured to be connected to the sample collecting member. The fluid analysis cartridge includes a sample receiving chamber configured to receive a sample collected by the sample collecting member and at least one hole arranged on one side of the sample receiving chamber and opened by connection of the sample collecting member to the fluid analysis cartridge to the at least one hole. The sample receiving chamber stores a buffer solution to be mixed with the sample.