The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2020

Filed:

Sep. 28, 2017
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Tomoharu Okuno, Kyoto, JP;

Assignee:

Shimadzu Corporation, Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto-shi, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/10 (2006.01); A61B 6/06 (2006.01);
U.S. Cl.
CPC ...
A61B 6/542 (2013.01); A61B 6/06 (2013.01); A61B 6/10 (2013.01); A61B 6/4464 (2013.01);
Abstract

Provided is an X-ray imaging apparatus capable of properly performing an automatic exposure control and an appropriately performing X-ray imaging control with a simple configuration. In cases where there exists a plurality of AEC photo pickup fields for automatic exposure, based on the positional information on an X-ray irradiation area and the AEC photo pickup field(s), the presence or absence of AEC photo pickup field(s) where all areas of the sensitive area are not included in the X-ray irradiation area is detected. In cases where there exist one or more AEC photo pickup fields not included in the X-ray irradiation area, the corresponding AEC photo pickup field is set to be unused. As a result, it is possible to appropriately perform an automatic exposure control and/or perform an X-ray imaging control appropriately with a simple structure.


Find Patent Forward Citations

Loading…