The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2020
Filed:
Oct. 05, 2015
Massachusetts Institute of Technology, Cambridge, MA (US);
Edward W. Obropta, Jr., Cape May Court House, NJ (US);
Dava J. Newman, Marblehead, MA (US);
MASSACHUSETTS INSTITUTE OF TECHNOLOGY, Cambridge, MA (US);
Abstract
Described embodiments provide a system and method for measuring surface deformation and strain using digital image correlation of a surface of a test object. A data acquisition system acquires images of the surface. The surface has a unique surface pattern to facilitate image acquisition. The images are grouped into one or more image sets. Three dimensional image correlation is performed on each of the image sets to determine deformation and strain data. The deformation and strain data from the image sets are stitched into one dataset. Principal strains and lines of non-extension (LoNEs) directions are determined. One or more LoNEs streamlines and lines of maximum and minimum extensions are determined. Visualizations for the strain magnitudes, LoNE streamlines, maximum and minimum extension streamlines are generated in three dimensions.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile