The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2020

Filed:

Aug. 24, 2019
Applicant:

Bertec Corporation, Columbus, OH (US);

Inventors:

Necip Berme, Worthington, OH (US);

Jaswandi Tushar Pitale, Plain City, OH (US);

Assignee:

Bertec Corporation, Columbus, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/103 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1036 (2013.01);
Abstract

A measurement system includes at least one measurement assembly having at least one measurement device, a head-mounted visual display device having an output screen, and a data processing device operatively coupled to the at least one measurement assembly and the head-mounted visual display device. The data processing device is configured to generate a visual element for superimposition onto a system user and/or an object being manipulated by the system user, and display the superimposed visual element on the head-mounted visual display device. The data processing device is further configured to generate the visual element using the output data from the at least one measurement assembly.


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