The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2020

Filed:

Mar. 02, 2018
Applicant:

Uptake Technologies, Inc., Chicago, IL (US);

Inventors:

Nelson Troy de Freitas, Chicago, IL (US);

Aparna Pandey, Chicago, IL (US);

Assignee:

Uptake Technologies, Inc., Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04L 12/24 (2006.01); G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
H04L 43/065 (2013.01); H04L 41/0681 (2013.01); G05B 19/41855 (2013.01); G05B 2219/31151 (2013.01); G05B 2219/31346 (2013.01);
Abstract

A computing system may be configured to obtain operating data for a manufacturing network that comprises a plurality of edge nodes, a plurality of intermediate nodes, and a root node. Based on the operating data, the computing system may determine a respective critical state indicator for each node in at least a given segment of the manufacturing network. Based on the respective critical state indicator for each node in the given segment, the computing system may recursively determine a respective health score for each node in the given segment of the manufacturing network. Based on the respective health score for each node in the given segment of the manufacturing network, the computing system may identify one or more nodes in the given segment that are anomalous and cause a client station to present a report of the one or more nodes that are identified to be anomalous.


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