The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2020

Filed:

Feb. 22, 2017
Applicant:

Red Hat, Inc., Raleigh, NC (US);

Inventor:

John Mazzitelli, Sicklerville, NJ (US);

Assignee:

Red Hat, Inc., Raleigh, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/16 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 43/024 (2013.01);
Abstract

Systems and methods for enabling additional metrics in a monitoring system to diagnose problems are disclosed. An example method may include collecting first metric data at a first collection frequency, determining whether the first metric data exceeds a first boundary defined by a first metric rule, responsive to determining that the first metric data exceeds the first boundary, collecting second metric data at a second collection frequency and collecting the first metric data at a third collection frequency, the second metric data and the third collection frequency defined by the first metric rule, determining whether the first metric data no longer exceeds the first boundary, and responsive to determining the first metric data no longer exceeds the first boundary, terminating collection of the second metric data while continuing to collect the first metric data at the first collection frequency.


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