The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2020

Filed:

Aug. 03, 2018
Applicant:

Samsung Display Co., Ltd., Yongin-si, Gyeonggi-do, KR;

Inventors:

Mohamed Elzeftawi, San Jose, CA (US);

Amir Amirkhany, Sunnyvale, CA (US);

Assignee:

Samsung Display Co., Ltd., Yongin-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 25/02 (2006.01); H03K 19/0185 (2006.01); H03M 1/68 (2006.01); H03K 19/00 (2006.01); H03M 1/00 (2006.01);
U.S. Cl.
CPC ...
H04L 25/0278 (2013.01); H03K 19/0005 (2013.01); H03K 19/018571 (2013.01); H03K 19/018585 (2013.01); H03M 1/002 (2013.01); H03M 1/68 (2013.01); H04L 25/0298 (2013.01);
Abstract

A method of performing coarse calibration of a voltage-mode (VM) driver having a plurality of driver slices connected in parallel includes setting a control code applied to activated driver slices of the plurality of driver slices to a maximum value to minimize an output resistance of the activated driver slices, activating one driver slice of the plurality of driver slices by applying the control code to the one driver slice, while disabling other driver slices of the plurality of driver slices, measuring an output resistance of the VM driver, determining whether the output resistance of the VM driver is greater than a desired resistance, and in response to determining that the output resistance of the VM driver is greater than a desired resistance activating one more driver slice of the plurality of driver slices.


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