The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
May. 14, 2018
U.s. Army Research Laboratory, Adelphi, MD (US);
Siddhartha Santra, Hyattsville, MD (US);
Brian T. Kirby, Baltimore, MD (US);
Vladimir S. Malinovsky, Clifton, NJ (US);
Michael Brodsky, Millburn, NJ (US);
The United States of America as represented by the Secretary of the Army, Washington, DC (US);
Abstract
Methods and systems for measuring interferometric visibility of telescopic signals using resources having imperfect quantum entanglement are disclosed. The novel methodology employed by embodiments of the present invention takes into account the difficulty in creating entanglement between distance telescopes, and describes how to incorporate problems associated with distributing quantum entanglement into the measurement procedure. This allows the distance that two telescopes in an optical array are spaced apart to be increased while still interacting.