The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
Dec. 17, 2018
SK Hynix Inc., Gyeonggi-do, KR;
Dae Sung Kim, Gyeonggi-do, KR;
Myung Jin Jo, Gyeonggi-do, KR;
Soon Young Kang, Gyeonggi-do, KR;
Wan Je Sung, Gyeonggi-do, KR;
SK hynix Inc., Gyeonggi-do, KR;
Abstract
An error correction device includes: a plurality of variable node units each configured to: receive a hard decision bit and a channel reliability value having a first bit-precision; and perform an iteration of a decoding operation on the hard decision bit based on the channel reliability value; a plurality of check node units each configured to: receive one or more reference reliability values having a second bit-precision from one or more variable node units coupled thereto among the plurality of variable node units during the iteration; and transmit, based on the one or more reference reliability values, one or more check reliability values having the second bit-precision to the one or more variable node units coupled thereto, wherein, during the iteration, each of the plurality of variable node units further: receives one or more first check reliability values from one or more check node units coupled thereto among the plurality of check node units; and updates the hard decision bit with reference to the channel reliability value and the one or more first check reliability values by upsizing the first bit-precision of the channel reliability value and the second bit-precision of the one or more first check reliability values.