The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
Jul. 24, 2017
Applicant:
Omron Corporation, Kyoto-shi, Kyoto, JP;
Inventors:
Kohei Tomita, Kyoto, JP;
Toru Fujii, Kyoto, JP;
Reiko Hattori, Souraku-gun, JP;
Takeshi Ashida, Nara, JP;
Assignee:
OMRON Corporation, Kyoto-shi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02H 1/00 (2006.01); H02S 50/00 (2014.01); G01R 31/08 (2006.01); G01R 31/12 (2006.01); H01L 31/02 (2006.01); H02H 3/10 (2006.01); H02H 3/32 (2006.01); H02H 7/20 (2006.01); G01R 31/40 (2014.01);
U.S. Cl.
CPC ...
H02H 1/0015 (2013.01); G01R 31/08 (2013.01); G01R 31/1227 (2013.01); H01L 31/02021 (2013.01); H02H 3/10 (2013.01); H02H 3/32 (2013.01); H02H 7/20 (2013.01); H02S 50/00 (2013.01); G01R 31/40 (2013.01);
Abstract
An arc detector includes a current sensor, a power spectrum conversion unit that converts an output from the current sensor to a power spectrum, a section value obtaining unit that divides an arc measurement section for the power spectrum into a plurality of regions, and obtains, from region values for the plurality of regions excluding a maximum one of the region values, a region value to be a section value of the arc measurement section, and an arc determination unit that determines a presence of an arc by comparing the section value with a threshold.