The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2020

Filed:

Aug. 28, 2017
Applicants:

Sumitomo Electric Industries, Ltd., Osaka-shi, JP;

Autonetworks Technologies, Ltd., Yokkaichi, Mie, JP;

Sumitomo Wiring Systems, Ltd., Yokkaichi, Mie, JP;

Inventors:

Misato Kusakari, Osaka, JP;

Tetsuya Kuwabara, Osaka, JP;

Yoshihiro Nakai, Osaka, JP;

Taichiro Nishikawa, Osaka, JP;

Yasuyuki Otsuka, Mie, JP;

Hayato Ooi, Mie, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B21C 1/02 (2006.01); C22C 21/00 (2006.01); C22F 1/04 (2006.01); H01B 7/02 (2006.01); H01B 13/14 (2006.01); H01B 1/02 (2006.01); H01B 13/00 (2006.01); H01B 13/02 (2006.01);
U.S. Cl.
CPC ...
H01B 1/023 (2013.01); B21C 1/02 (2013.01); C22C 21/00 (2013.01); C22F 1/04 (2013.01); H01B 7/02 (2013.01); H01B 13/0016 (2013.01); H01B 13/0207 (2013.01); H01B 13/14 (2013.01);
Abstract

An aluminum alloy wire is composed of an aluminum alloy. The aluminum alloy contains equal to or more than 0.005 mass % and equal to or less than 2.2 mass % of Fe, and a remainder of Al and an inevitable impurity. In a transverse section of the aluminum alloy wire, a surface-layer crystallization measurement region in a shape of a rectangle having a short side length of 50 μm and a long side length of 75 μm is defined within a surface layer region extending from a surface of the aluminum alloy wire by 50 μm in a depth direction, and an average area of crystallized materials in the surface-layer crystallization measurement region is equal to or more than 0.05 μmand equal to or less than 3 μm.


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