The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
Jun. 19, 2015
Washington University, St. Louis, MO (US);
The Regents of the University of California, Oakland, CA (US);
Sridhar Yaddanapudi, St. Louis, MO (US);
Sreekrishna M. Goddu, St. Louis, MO (US);
Sasa Mutic, St. Louis, MO (US);
Todd Pawlicki, San Diego, CA (US);
WASHINGTON UNIVERSITY, Saint Louis, MO (US);
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA, Oakland, CA (US);
Abstract
The present invention is a method or system for acceptance testing and commissioning of a LINAC and treatment planning system (TPS). For a LINAC commissioning, the present invention collects reference data from a fully calibrated LINAC and compares the reference data with machine performance data collected from a testing LINAC. The compared results are analyzed to assess accuracy of the testing LINAC. For a TPS commissioning, the present invention collects standard reference data from standard treatment plans and standard input data and compares the standard reference data with results from standard tests that are performed by a testing treatment plan system. The compares results are analyzed to assess accuracy of the testing treatment plan system.