The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
Dec. 18, 2015
International Business Machines Corporation, Armonk, NY (US);
Lukasz G. Cmielowski, Kraków, PL;
Marek Franczyk, Bojszowy, PL;
Tymoteusz Gedliczka, Kraków, PL;
Andrzej J. Wrobel, Cracow, PL;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
The disclosed herein relates to a method for failure rate prediction of a feature of a system under development. The method is executed by a processor coupled to a memory. The method includes defining a feature state of the feature during a predetermined time interval, the predetermined time interval being associated with a development stage of the system. The method also includes assigning a first defect class value to the feature for the predetermined time interval, the first defect class value configured to indicate a first condition and selecting, when a defect is reported for the feature, a second defect class value indicating a second condition, the second condition being associated with a higher failure rate than the first condition. The method can be embodied in system and a computer program product.