The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
Jul. 29, 2016
Splunk, Inc., San Francisco, CA (US);
Adam Oliner, San Francisco, CA (US);
Zidong Yang, San Francisco, CA (US);
Sinduja Sreshta, San Francisco, CA (US);
SPLUNK INC., San Francisco, CA (US);
Abstract
Described herein is a technology that facilitates the production of and the use of automated datagens for event-based systems. A datagen (i.e., data-generator or data generation system) is a component, module, or subsystem of computer systems that searches, monitors, and analyzes machine data. Existing datagens are not capable of detecting an anomaly in machine data. An anomaly is a variance in the input data stream that exceeds some acceptable amount of deviation from the norm (i.e., standard, expectation, etc.). An embodiment of datagen, in accordance with the technology described herein, detects anomalies in the input machine data.