The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
Nov. 09, 2017
Applicant:
Here Global B.v., Eindhoven, NL;
Inventors:
David Doria, Oak Park, IL (US);
Xin Chen, Evanston, IL (US);
Coby Spolin Parker, Santa Monica, CA (US);
Zichen Li, Evanston, IL (US);
Assignee:
HERE Global B.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01S 17/89 (2006.01); G01S 17/42 (2006.01); G06T 7/521 (2017.01); G01S 17/93 (2006.01); G01S 7/48 (2006.01); G05D 1/02 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00798 (2013.01); G01S 7/4808 (2013.01); G01S 17/42 (2013.01); G01S 17/89 (2013.01); G06K 9/00791 (2013.01); G06T 7/521 (2017.01); G01S 17/936 (2013.01); G05D 1/0231 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30252 (2013.01);
Abstract
The present embodiments provide for automatically detecting the location and severity of occluded regions within input data. A grid representation of a scene is generated from a data set, characterizing spaces of the grid representation as free, occupied, and hidden/occluded. The grid is bounded, and a connected component analysis is performed on the hidden space to identify the occluded regions.