The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
Mar. 19, 2014
Infosys Limited, Bangalore, IN;
Lokendra Shastri, Bhopal, IN;
K. Antony Arokia Durai Raj, Pollachi, IN;
Balasubramanian Kanagasabapathi, Erode, IN;
Infosys Limited, Bangalore, IN;
Abstract
The technique relates to a system and method for data-driven anomaly detection. This technique involves identifying region of interest from the data based on dimensionality reduction technique and change point detection algorithm. A reference data can be obtained separately or can be obtained from the test data also, wherein the reference data represent the normal operating condition of a system. The reference data are classified into different groups representing different modes of operation of the system. A control limit is determined for the different groups. The data within the region of interest are mapped with the different groups of the reference data and it is determined if the mapped data fall outside of the control limit of the mapped group. Finally, at least one abnormal event is detected by applying a heuristic algorithm on the data within the region of interest which are outside the control limit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile