The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2020

Filed:

May. 07, 2015
Applicant:

Informatica Llc, Redwood City, CA (US);

Inventors:

Lin Jiang, Palo Alto, CA (US);

Ratheesh Narayanan, Sunnyvale, CA (US);

Liam Friedland, Redwood City, CA (US);

Assignee:

Informatica LLC, Redwood City, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/25 (2019.01); G06F 16/22 (2019.01);
U.S. Cl.
CPC ...
G06F 16/254 (2019.01); G06F 16/221 (2019.01);
Abstract

A data profiling server extracts data from multiple data sources and stores the extracted data in a target data store. Validation functions are performed on the extracted to determine whether the data conforms to validation rules associated with the target data store and/or business logic definitions. For data that does not conform to the validation rules, the data profiling server identifies recommended transformations to be applied to the data to correct any errors that cause the data to not conform with the validation rules. A data profiling application presents to a user the data extracted from the multiple data sources in a grid structure. The grid structure also includes error indicators identifying the data that does not conform to the validation rules and specifies the recommended transformations identified by the data profiling server.


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