The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
Jul. 02, 2015
Opshub, Inc., Palo Alto, CA (US);
Sandeep Jain, Palo Alto, CA (US);
Ramesh Venkataraman, San Ramon, CA (US);
OPSHUB, INC., , CA (US);
Abstract
A system and method for analyzing risk factors to enhance the quality of program code have been disclosed. The risks are identified and evaluated, post which test cases are defined for each of the identified risk factors. Further, the defect density, code complexity and change rate corresponding to each of the test cases is determined. Risk profiles are created for each of the test cases. The risk profiles are categorized based on defect density, complexity of the code and change rate. The test cases are evaluated depending upon the risk posed by new scripts added to the program code. The scripts need to be executed for satisfying a necessary and sufficient condition are decided based on the correlation between program code files, activities on those files, defects corresponding to those files and test cases used to test those defects.