The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10552258 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 04, 2020

Filed:

Sep. 05, 2017
Applicant:

Semiconductor Energy Laboratory Co., Ltd., Atsugi-shi, Kanagawa-ken, JP;

Inventors:

Fumika Akasawa, Kanagawa, JP;

Seiichi Yoneda, Kanagawa, JP;

Assignee:

Semiconductor Energy Laboratory Co., Ltd., Atsugi-shi, Kanagawa-ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/10 (2006.01); G02F 1/1335 (2006.01); G09G 3/3225 (2016.01); G09G 3/36 (2006.01); H01L 27/32 (2006.01); G11C 11/16 (2006.01); G11C 11/41 (2006.01); H01L 27/12 (2006.01); H01L 29/786 (2006.01); H01L 51/00 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G02F 1/133602 (2013.01); G06F 11/1004 (2013.01); G09G 3/3225 (2013.01); G09G 3/3648 (2013.01); H01L 27/3232 (2013.01); H01L 27/3262 (2013.01); G02F 2001/133616 (2013.01); G02F 2001/133618 (2013.01); G02F 2201/44 (2013.01); G02F 2203/02 (2013.01); G09G 2330/12 (2013.01); G09G 2380/02 (2013.01); G11C 11/16 (2013.01); G11C 11/41 (2013.01); H01L 27/1225 (2013.01); H01L 29/7869 (2013.01); H01L 51/0097 (2013.01); H01L 2227/323 (2013.01); H01L 2227/326 (2013.01); H01L 2251/5338 (2013.01);
Abstract

A semiconductor device that is less likely to be affected by a soft error is provided. The semiconductor device includes a first memory, a second memory, a processor that can be connected to the first memory and the second memory, and a selector for selectively connecting one of the first memory and the second memory to the processor. The probability of occurrence of a soft error of the first memory is higher than that of the second memory. When an error derived from a soft error is detected in the first memory, the selector connects the second memory to the processor. The semiconductor device can stably operate even when moved from an environment where a soft error is less likely to occur to an environment where a soft error is likely to occur.


Find Patent Forward Citations

Akasawa, Fumika. (2020). Semiconductor device, electronic device, and driving method thereof (U.S. Patent No. 10552258). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10552258

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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