The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
Nov. 16, 2018
Uptake Technologies, Inc., Chicago, IL (US);
Aparna Pandey, Chicago, IL (US);
Nelson Troy de Freitas, Chicago, IL (US);
Uptake Technologies, Inc., Chicago, IL (US);
Abstract
A computing system may evaluate the operation of a manufacturing network using at least two of (a) macro-level threshold criteria indicating anomalous operation of the manufacturing network as a whole, (b) micro-level threshold criteria indicating anomalous operation of any of a plurality of micro-networks in the manufacturing network, (c) path-level threshold criteria indicating anomalous operation of any of a plurality of node paths in the manufacturing network, or (d) node-level threshold criteria indicating anomalous operation of any of a plurality of individual nodes in the manufacturing network. Based on the evaluating, computing system may identify at least one anomaly in the manufacturing network and then trigger at least one action that is directed to resolving the at least one anomaly.