The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2020

Filed:

Dec. 08, 2016
Applicant:

Ambarella, Inc., Santa Clara, CA (US);

Inventors:

Wen Wan Yang, San Francisco, CA (US);

Peter Verplaetse, Redwood City, CA (US);

Assignee:

Ambarella, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/30 (2018.01); G06F 9/38 (2018.01);
U.S. Cl.
CPC ...
G06F 9/30036 (2013.01); G06F 9/3001 (2013.01); G06F 9/3802 (2013.01);
Abstract

An apparatus including a memory and a circuit. The memory may be configured to store a multidimensional array of data values. The circuit may be configured to (i) fetch a plurality of data vectors from the memory, where each of the data vectors comprises a plurality of the data values, (ii) calculate a plurality of modification values based on the data values, (iii) calculate a first value of a first window based on the data values, and (iv) calculate a second value of a second window by adding to the first value of the first window a next one of the modification values and subtracting from the first value of the first window a previous one of the modification values. The second window generally overlaps the first window in the multidimensional array along a particular axis.


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