The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2020

Filed:

Jun. 10, 2015
Applicant:

Universidad Carlos Iii DE Madrid, Leganes, Madrid, ES;

Inventors:
Assignee:

UNIVERSIDAD CARLOS III DE MADRID, Leganes, Madrid, ES;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G06T 15/08 (2011.01); H04N 13/02 (2006.01); G02B 21/06 (2006.01); G02B 21/26 (2006.01); G06T 11/00 (2006.01); G06T 15/00 (2011.01); G02B 21/16 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 21/06 (2013.01); G02B 21/16 (2013.01); G02B 21/26 (2013.01); G06T 11/006 (2013.01); G06T 15/00 (2013.01); G06T 15/08 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/20048 (2013.01);
Abstract

The invention relates to a microscope and a method for producing 3D images of various transparent or semi-transparent samples, fundamentally comprising: causing a relative movement according to the detection direction between the sheet of light and the sample while maintaining a constant angle of acquisition; producing, for said angle of acquisition, a single 2D projection image formed by a representative parameter for each pixel; modifying the angle of acquisition by means of a relative rotation between the sheet of light and the sample, combined with a relative vertical translation between the sheet of light and the sample, and repeating the previous steps; and generating a 3D image of each of the samples from the set of 2D projection images that are produced.


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