The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
Dec. 07, 2015
3m Innovative Properties Company, St. Paul, MN (US);
Anthony J. Sabelli, Darien, CT (US);
Jennifer F. Shumacher, Woodbury, MN (US);
Yanina Shkel, Princeton, NJ (US);
Brian J. Stankiewicz, Mahtomedi, MN (US);
Glenn E. Casner, Woodbury, MN (US);
John A. Wheatley, Lake Elmo, MN (US);
Andrew P. Bonifas, Alberta, CA;
Ravishankar Sivalingam, Foster City, CA (US);
3M INNOVATIVE PROPERTY COMPANIES, St. Paul, MN (US);
Abstract
Systems and methods for authenticating material samples are provided. Characteristic features are measured for a batch of material samples that comprise substantially the same composition and are produced by substantially the same process. The measured characteristic features have respective variability that is analyzed to extract statistical parameters. In some cases, reference ranges are determined based on the extracted statistical parameters for the batch of material samples. The corresponding statistical parameters of a test material sample are compared to the reference ranges to verify whether the test material sample is authentic.