The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2020

Filed:

Aug. 07, 2014
Applicant:

The Board of Trustees of the University of Illinois, Urbana, IL (US);

Inventors:

Curtis L. Johnson, Urbana, IL (US);

Bradley Sutton, Savoy, IL (US);

John G. Georgiadis, Champaign, IL (US);

Joseph L. Holtrop, Champaign, IL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/563 (2006.01); G01R 33/567 (2006.01); G01R 33/561 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56358 (2013.01); G01R 33/5611 (2013.01); G01R 33/5676 (2013.01); G01R 33/56545 (2013.01);
Abstract

A method and system provides an acquisition scheme for generating MRE displacement data with whole-sample coverage, high spatial resolution, and adequate SNR in a short scan time. The method and system can acquire in-plane k-space shots over a volume of a sample divided into a plurality of slabs that each include a plurality of slices to obtain three dimensional multislab, multishot data, can apply refocusing pulses to the sample, can acquire navigators after the refocusing pulses, and can correct for phase errors based on an averaging of the navigators.


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