The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2020

Filed:

Jun. 29, 2017
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Ek Tsoon Tan, Mechanicville, NY (US);

Giang-Chau Ngo, Champaign, IL (US);

Christopher Judson Hardy, Schenectady, NY (US);

Thomas Kwok-Fah Foo, Clifton Park, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/48 (2006.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
G01R 33/4818 (2013.01); G01R 33/56 (2013.01);
Abstract

A magnetic resonance (MR) imaging method performed by an MR imaging system includes acquiring MR data in multiple shots and multiple acquisitions (NEX), separately reconstructing the component magnitude and phase of images corresponding to the multiple shots and multiple NEX, removing the respective phase from each of the images, and combining, after removal of the respective phase, the shot images and the NEX images to produce a combined image. The method further includes using the combined image to calculate the full k-space data for each shot and NEX and replacing unacquired k-space data points with calculated k-space data points. The operations are repeated until the combined image reaches a convergence.


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