The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2020

Filed:

Oct. 07, 2014
Applicant:

Eppendorf Ag, Hamburg, DE;

Inventors:

Wolfgang Goemann-Thoss, Hamburg, DE;

Wolf Wente, Hamburg, DE;

Andreas Thieme, Hamburg, DE;

Jan-Gerd Frerichs, Norderstedt, DE;

Christiane Markau, Hamburg, DE;

Jan-Hendrik Hacker, Hamburg, DE;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00871 (2013.01); G01N 35/0092 (2013.01); G01N 2035/0091 (2013.01); G01N 2035/0094 (2013.01); G01N 2035/00881 (2013.01); Y10T 436/11 (2015.01);
Abstract

The invention relates to a laboratory instrument for the instrument-controlled handling of a partial problem in a treatment process which contains treatments of at least one laboratory sample. The invention moreover relates to a system containing a plurality of such laboratory instruments, wherein the system serves for the instrument-controlled handling of a problem containing a plurality of these partial problems in the treatment process of at least one laboratory sample. And the invention relates to a method for the instrument-controlled handling of a partial problem in a treatment process which contains treatments of at least one laboratory sample.


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