The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
May. 12, 2017
Becton, Dickinson and Company, Franklin Lakes, NJ (US);
Christian Sandmann, Wayne, NJ (US);
Erik Kurt Witt, Wyckoff, NJ (US);
BECTON, DICKINSON AND COMPANY, Franklin Lakes, NJ (US);
Abstract
A system and method for classifying a sample are provided. The system includes a housing containing the sample, a sensing element to measure at least one physical parameter of the same, and a processor configured to receive and analyze the physical parameter measurement, and to determine if the sample can be classified based on the measurement. If the sample cannot be classified, the processor selects and applies other analytical techniques until the sample is classified. The method includes selecting an analytical technique to apply to a sample, applying the technique to the sample, obtaining the results of the analytical technique, and determining if the sample can be classified based on the analytical technique. The method further includes selecting and applying further analytical techniques if the sample was not classified, until the sample is able to be classified.