The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
Feb. 18, 2015
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Toshinobu Yanagisawa, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto-shi, JP;
Abstract
Provided is a systemfor monitoring an operating status of a chromatograph to determine whether or not an abnormality due to an external condition independent of the characteristics of a sample being analyzed is present in the operating status of the chromatograph. This system includes: an external-condition measurement device (pressure sensorA, column oven thermometerB and room temperature thermometerC) for performing a time-series of measurement of the external condition and for obtaining a series of external-condition-related data; an index value calculatorfor calculating an index value based on the series of the external-condition-related data obtained through an analysis; and an index value storage (data storage) for storing the index value for the analysis, with the index value being linked with an analysis data obtained through the analysis.